Wind River Workbench Diagnostics 1.0
Wind River Workbench Diagnostics 1.0, an add-on product to VxWorks-based platforms, is a root-cause analysis tool set that records, isolates, diagnoses, and corrects device software faults. The tool set includes run-time components for on-device data acquisition and data offload, as well as diagnostics tools to isolate and diagnose software faults. Workbench Diagnostics increases developer productivity by compressing debug cycles and eliminating unnecessary instrumentation-build-test cycles.
Workbench Diagnostics offers complete access to running applications with sensor points and core images. A sensor point is software used to instrument "live" applications dynamically without modifying the application source code, rebuilding the application, reflashing development boards, or rebooting the target. A core image is a snapshot of system memory - the VxWorks 6.2 kernel generates core images when exceptions occur. Diagnostic extensions to Workbench provide debugging workflows to instrument the application, collect debug data as faults occur, analyze data to determine the root cause of a fault, and correct the application.
Components
Workbench Diagnostics includes the following run-time components and features:
- Device management agent
- VxWorks 6.2 core image aware
- Sensor point management
- Robust data offload
- Minimally intrusive; small footprint
- Scalable, configurable
- Source code availability
- Sensor point workflow
- Workbench-based sensor point development
- Sensor point management with Diagnostics plug-in
- Sensor point log analysis with Sensor Point Log Viewer
- Core analysis workflow
- Core image extraction with Diagnostics plug-in
- Core file analysis with Workbench Debugger
Benefits
Workbench Diagnostics compresses time-to-resolution of problems encountered during the implementation phase of the development life cycle. Benefits include:
- Improves development productivity
- Enables fact-driven analysis
- Allows streamlined testing workflow
- Minimizes project delays by reducing time for defect resolution during development
- Increases overall device reliability (test early and often)
- Enables developers to make go-to-market decisions with confidence
